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| 009 | 185300286 | ||
| 003 | http://www.sudoc.fr/185300286 | ||
| 005 | 20250630092504.0 | ||
| 010 | _a0408185503 | ||
| 090 | _a15004 | ||
| 099 |
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| 100 | _a20150502h19671965k y0frey50 ba | ||
| 101 | 0 |
_aeng _2639-2 |
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| 102 | _aGB | ||
| 105 | _aa a 001yy | ||
| 106 | _ar | ||
| 181 |
_6z01 _ctxt _2rdacontent |
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_6z01 _ai# _bxxxe## |
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| 182 |
_6z01 _cn _2rdamedia |
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_6z01 _an |
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| 200 | 1 |
_aElectron microscopy of thin crystals _fby P. B. Hirsch,... A. Howie,... R. B. Nicholson,... [et al.] |
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| 205 | _aSecond impression revised | ||
| 210 |
_aLondon _cButterworths _d1967, cop. 1965 |
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| 215 |
_a1 vol. (VIII-549 p.) _cill. _d26 cm |
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| 305 | _aRéimpressions : 1969, 1971 | ||
| 320 | _aNotes bibliographiques en fin de chapitre. Index | ||
| 606 |
_aElectron microscopes _2lc |
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| 606 |
_aCrystallography _2lc |
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| 606 |
_aElectrons _xDiffraction _2lc |
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| 606 |
_aElectron microscopy _2lc |
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| 606 |
_3027579069 _aMicroscopie électronique _2rameau |
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| 606 |
_3027576809 _aCristallographie _2rameau |
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| 606 |
_3030014131 _aÉlectrons _xDiffraction _2rameau |
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| 700 | 1 |
_3085817996 _aHirsch _bPeter Bernhard _f19..-.... _4070 |
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