| 000 | 00544nam a22001577a 4500 | ||
|---|---|---|---|
| 001 | 16605 | ||
| 010 | _a9780735422704 | ||
| 010 |
_a978-0-7354-2269-8 _EPUBb |
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| 090 | _a16605 | ||
| 099 |
_tOUVR _zALEX32901 |
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| 100 | _a20241101d2021 m||y0frey50 ba | ||
| 200 | _aCharacterization of Defects and Deep Levels for GaN Power Devices | ||
| 214 |
_aNew-York _cAIP Publishing _d2021 |
||
| 215 | _a224 pp. | ||
| 700 |
_aTETSUO _bNarita _4070 |
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| 856 |
_uhttps://aip.scitation.org/doi/book/10.1063/9780735422698 _zLivre électronique |
||