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200	1		_aProceedings of the IEEE
207		0	_aVol. 51, no. 1 (Jan. 1963)-
210			_aNew York, N.Y. _cInstitute of Electrical and Electronics Engineers _d1963-
215			_d28 cm
326			_aMensuel
430			_0036657425 _tProceedings of the IRE _x0096-8390
452			_0116255498 _tProceedings of the IEEE (Online) _x1558-2256
530	0		_aProceedings of the IEEE
531			_aProc. I.E.E.E.
606			_3027796272 _aÉlectricité _2rameau
606			_3027270297 _aÉlectronique _2rameau
606			_3027474518 _aÉlectrotechnique _2rameau
606			_3027252906 _aTélécommunications _2rameau
606			_3027234886 _aInformatique _2rameau
608			_302724640X _aPériodique _2rameau
675			_a537
675			_a621.3
676			_a621.381/05
710	0	2	_3026412217 _aInstitute of Electrical and Electronics Engineers _4070
801		3	_aFR _bAbes _c20240820 _gAFNOR
801		3	_aFR _bISSN _c20210901
802			_a01
930			_5751055219:16839587801 _b751055219 _jf
955	4	1	_5751055219:16839587801 _a51 _i1963 _a72 _b2 _i1984
955	4	1	_5751055219:16839587801 _a77 _i1989 _a93 _b11 _i2005 _wLacunes _rvol. 51 (1963) - vol. 72 no. 2 (1984) ; vol. 77 (1989) - vol. 93 no. 11 (2005) [Lacunes]
959			_5751055219:16839587801 _d78 _e4, 7 _a1990 _0 _d80 _e2 _a1991 _0 _d82 _e9 _a1992 _0 _d87 _e7 _a1997 _0 _d90 _e4 _a2003 _0 _d92 _e3 _a2004 _rvol. 78 no.4, 7 (1990) ; vol. 80 no.2 (1991) ; vol. 82 no.9 (1992) ; vol. 87 no.7 (1997) ; vol. 90 no.4 (2003) ; vol. 92 no.3 (2004)